Basic training in the EMU

All training in the EMU is aimed at helping our users achieve the best results. Users of the EMU are encouraged to seek assistance from EMU staff if they have questions, both during and after the formal training. EMU staff have extensive experience in the microscopy of a very wide range of samples and techniques.

Basic training includes:

·       Lab induction

·       Specimen preparation

·       Introduction to instrument and technique

·       Training to independent level

·       Introduction to data processing

If training is not appropriate, staff operated microscope use is available.

 

Basic TEM training

Lab induction (1 hour)

Specimen preparation

Application of a nanoparticle sample to a TEM grid.

3 x 2 hour microscope sessions.

              Session 1 (small group of 1 to 3 users)

                           Introduction to the instrument

                           Demonstration of specimen exchange

                           Demonstration of beam alignment

                           Image acquisition (magnification, focusing)

                           Demonstration of how to save and download images/data

              Session 2 (small group of 1 to 3 users)

                           Hands on specimen exchange (with instructor supervision)

                           Hands on beam alignment (with instructor supervision)

                           Hands on image acquisition (with instructor supervision)

              Session 3 (one user only)

Student demonstrates specimen exchange, beam alignment and image acquisition to instructor

Instructor and student work on specific imaging questions relating to their own sample

If user meets competency criteria, they are given independent access to the instrument

 

Basic SEM training

Lab induction (1 hour)

Specimen preparation

              Specimen mounting

              Specimen coating (if required)

3 x 2 hour microscope sessions.

              Session 1 (small group of 1 to 3 users)

                           Introduction to the instrument

                           Demonstration of specimen exchange

                           Demonstration of beam parameter selection

                           Image acquisition (magnification, focusing)

                           Demonstration of how to save and download images/data

              Session 2 (small group of 1 to 3 users)

                           Hands on specimen exchange (with instructor supervision)

                           Hands on beam parameter selection (with instructor supervision)

                           Hands on image acquisition (with instructor supervision)

              Session 3 (one user only)

Student demonstrates specimen exchange, beam parameter selection and image acquisition to instructor

Instructor and student work on specific imaging questions relating to their own sample

If user meets competency criteria, they are given independent access to the instrument

 

Basic AFM training

Lab induction (1 hour)

Specimen preparation

              Specimen mounting

3 x 2 hour microscope sessions.

              Session 1 (one-on one training)

                           Introduction to the instrument

                           Choice of appropriate probes

                           Demonstration of specimen exchange

                           Demonstration of basic operation of the instrument

                           Demonstration of how to save and download images/data

Demonstration of basic image analysis

              Session 2 (one-on-one training)

                           Hands on specimen exchange (with instructor supervision)

                           Hands on operation of instrument (with instructor supervision)

                           Hands on image acquisition and analysis (with instructor supervision)

              Session 3 (one-on-one training)

User demonstrates specimen exchange and image acquisition to instructor

If user meets competency criteria, they are given independent access to the instrument

 

Basic FIB training

Lab induction (1 hour)

Specimen preparation

              Specimen mounting

              Specimen coating (if required)

xP200 FIB

              6 hours of one-on-one instrument training

                           Specimen exchange

                           Basic instrument operation

                           Basic milling/patterning

                           How to save and download images

If user meets the competency criteria, they are given independent access to the instrument

Nanolab Dual Beam FIB

              10 hours of on-on-one training

                           Specimen exchange

                           Basic instrument operation

                           Using the SEM and ion beams

                           Basic milling/patterning

                           How to save and download images

If user meets the competency criteria, they are given independent access to the instrument

 

Auriga FIB

              10 hours of one-on-one training

                           Specimen exchange

                           Basic instrument operation

                           Using the SEM and ion beams

                           Basic milling/patterning

                           How to save and download images

If user meets the competency criteria, they are given independent access to the instrument

 

Lift-out for TEM specimens

              3 hours of one-on-one training

                           Making the needle

                           Using the micro-manipulators

 

EPMA training

Note: Users of EPMA must attain independent user status for one of the SEMs first.

Lab induction (1 hour)

Specimen preparation

                           Specimen mounting

                           Specimen coating (if required)

3 x 3 days of one-on-one training

              Calibration

              Beam parameter selection

              Mapping

              Quantitative data acquisition

              Data analysis

 

Cryo-TEM training

Note: Users of cryo-TEM must attain independent user status for the Tecnai TEM first.

Specimen preparation

                           Grid plunging

6 x 4 hours of one-on-one training

              Specimen exchange under cryo-conditions

              Beam alignment and imaging for cryo-TEM

              Working under low-dose conditions

 

Critical point drying (CPD)

Specimen preparation

                           Fixation

                           Dehydration

3 x 2 hours of one-on-one training

              Session 1 – demonstration by instructor

              Session 2 – hands on operation with close supervision

              Session 3 – Hands on operation with supervision

 

Negative staining for TEM

Grid preparation (if required)

                 Using the glow discharge instrument

2 x 1 hour of one-on-one training

                Session 1 – demonstration by instructor and trial of staining options

                Session 2 – hands on operation with close supervision

 

Preparation of biological samples for TEM

Specimen preparation (3 days)

             Fixation

             Dehydration

             Resin embedding

Ultramicrotomy (4 x 2hr sessions)

              Making a glass knife

              Using the ultramicrotome

              Picking up the sections

Positive staining of ultrathin sections (2 x 1 hour sessions)

              Lead citrate staining

              Uranyl acetate staining

Sample polishing for SEM or TEM

Hitachi IM-4000 Ion Polisher (2 hours)

            Specimen preparation

Demonstration

Hands-on operation with supervision

PIPS (Precision Ion Polishing System) (4 Hours)

             Specimen preparation

             Demonstration

             Hands-on operation with supervision