The instrument is a UV-visible-NIR thin film analyser which can provide a measurement of the thickness of multilayer films. The instrument measures light reflected perpendicular to a sample surface which can provide information on the thickness of up to 4 layers in a sample, and is useful for an independent comparison with film-thickness measurements obtained on the MRD. The wavelengths available range from 250nm to 850nm, which enable measurement of film thickness from 10nm up to 20micron. This instrument is located in lab G65, and it available at no charge to UNSW users.
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Contact & Address (SSEAU)
Solid State & Elemental Analysis Unit:
Room G61
F10 June Griffith Building (Chemical Sciences)
UNSW Sydney NSW 2033
Tel: +61 (2) 9385 4693
Fax: +61 (2) 9385 4663
Email: c.marjo@unsw.edu.au
Deliveries (before 4pm)
Lower Campus Store
UNSW Sydney
GQ13 SEB Building (E8)
Via Gate 2 High Street
Kensington NSW 2033
