Professor Peter Cumpson

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Executive Director

Research profile: Click to view

Publications

Book Chapters

Soo DJW; Osni MHB; Pasbakhsh P; De Silva R; Cumpson P; Goh KL, 2019, 'Micromechanical Characterization of Poly(Lactic Acid)/Halloysite Bionanocomposite Membrane', in Nanostructured Polymer Composites for Biomedical Applications, Elsevier, pp. 53 - 67, http://dx.doi.org/10.1016/b978-0-12-816771-7.00003-x
Cumpson PJ; Clifford CA; Portoles JF; Johnstone JE; Munz M, 'Cantilever Spring-Constant Calibration in Atomic Force Microscopy', in Nano Science and Technolgy, Springer Berlin Heidelberg, pp. 289 - 314, http://dx.doi.org/10.1007/978-3-540-74080-3_8
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Conference Abstracts

Purvis G; van der Land C; Sano N; Cumpson P; Gray N, 2020, 'Combining morphological and organic geochemical evidence for investigating putative ichnofossils: A case study for an approach for the detection of fossilised life on Mars', in EGU General Assembly Conference Abstracts, presented at EGU General Assembly Conference, https://ui.adsabs.harvard.edu/abs/2020EGUGA..2222041P/abstract

Conference Papers

Wang J; Cumpson PJ, 2007, 'Modelling of angle-resolved x-ray photoelectron spectroscopy (ARXPS) intensity ratios for nanocharacterization of closely packed shell-core nanofibres', in Instrumentation, Metrology, and Standards for Nanomanufacturing, SPIE, presented at NanoScience + Engineering, http://dx.doi.org/10.1117/12.732364
Hedley J; Burdess JS; Harris AJ; Gallacher BJ; McNeil CJ; Cumpson PJ; Enderling S, 2004, 'An optical workstation for characterization and modification of MEMS', in Optical Micro- and Nanometrology in Manufacturing Technology, SPIE, presented at Photonics Europe, http://dx.doi.org/10.1117/12.545596
Cumpson P; Hedley J, 2004, 'A Microfabricated Spring-Constant Calibration Device for Atomic Force Microscopy (AFM) Potentially Traceable to the SI', in 2004 Conference on Precision Electromagnetic Measurements, IEEE, presented at 2004 Conference on Precision Electromagnetic Measurements, 27 June 2004 - 02 July 2004, http://dx.doi.org/10.1109/cpem.2004.305567
Milton MJT; Cumpson PJ, 'Nano-scale integrity and coherence of the S.I', in Conference Digest Conference on Precision Electromagnetic Measurements, IEEE, presented at 2002 Conference on Precision Electromagnetic Measurement, http://dx.doi.org/10.1109/cpem.2002.1034848

Journal articles

Moeini B; Linford MR; Fairley N; Barlow A; Cumpson P; Morgan D; Fernandez V; Baltrusaitis J, 2021, 'Definition of a new (Doniach-Sunjic-Shirley) peak shape for fitting asymmetric signals applied to reduced graphene oxide/graphene oxide XPS spectra', Surface and Interface Analysis, http://dx.doi.org/10.1002/sia.7021
Purvis G; Sano N; van der Land C; Barlow A; Cumpson P; Gray N; Lopez-Capel E, 2021, 'A comparison of the molecular composition of plant and fungal structural biopolymer standards with the organic material in early cretaceous Ontong Java Plateau Tuff', Chemical Geology, vol. 565, http://dx.doi.org/10.1016/j.chemgeo.2021.120078
Cumpson PJ; Jaskiewicz M; Kim WK, 2021, 'Argon cluster-ion sputter yield: Molecular dynamics simulations on silicon and equation for estimating total sputter yield', Surface and Interface Analysis, http://dx.doi.org/10.1002/sia.6996
Xiang H; Rasul S; Hou B; Portoles J; Cumpson P; Yu EH, 2020, 'Copper-Indium Binary Catalyst on a Gas Diffusion Electrode for High-Performance CO2 Electrochemical Reduction with Record CO Production Efficiency.', ACS Appl Mater Interfaces, vol. 12, pp. 601 - 608, http://dx.doi.org/10.1021/acsami.9b16862
Cumpson P; Sheriff J; Fletcher IW, 2020, 'Computer-readable Image Markers for Automated Registration in Correlative Microscopy', arXiv preprint arXiv:2011.14949, https://arxiv.org/abs/2011.14949
Purvis G; Sano N; van der Land C; Barlow A; Lopez-Capel E; Cumpson P; Hood J; Sheriff J; Gray N, 2019, 'Combining thermal hydrolysis and methylation-gas chromatography/mass spectrometry with X-ray photoelectron spectroscopy to characterise complex organic assemblages in geological material', MethodsX, vol. 6, pp. 2646 - 2655, http://dx.doi.org/10.1016/j.mex.2019.10.034
Sheraz S; Tian H; Vickerman JC; Blenkinsopp P; Winograd N; Cumpson P, 2019, 'Enhanced Ion Yields Using High Energy Water Cluster Beams for Secondary Ion Mass Spectrometry Analysis and Imaging', Analytical Chemistry, vol. 91, pp. 9058 - 9068, http://dx.doi.org/10.1021/acs.analchem.9b01390
Purvis G; van der Land C; Sano N; Cockell C; Barlow A; Cumpson P; Lopez-Capel E; Gray N, 2019, 'The organic stratigraphy of Ontong Java Plateau Tuff correlated with the depth-related presence and absence of putative microbial alteration structures', Geobiology, vol. 17, pp. 281 - 293, http://dx.doi.org/10.1111/gbi.12326
Braeuninger-Weimer P; Burton O; Weatherup RS; Wang R; Dudin P; Brennan B; Pollard AJ; Bayer BC; Veigang-Radulescu VP; Meyer JC; Murdoch BJ; Cumpson PJ; Hofmann S, 2019, 'Reactive intercalation and oxidation at the buried graphene-germanium interface', APL Materials, vol. 7, pp. 071107 - 071107, http://dx.doi.org/10.1063/1.5098351
Wilde CA; Ryabenkova Y; Firth IM; Pratt L; Railton J; Bravo-Sanchez M; Sano N; Cumpson PJ; Coates PD; Liu X; Conte M, 2019, 'Novel rhodium on carbon catalysts for the oxidation of benzyl alcohol to benzaldehyde: A study of the modification of metal/support interactions by acid pre-treatments', Applied Catalysis A: General, vol. 570, pp. 271 - 282, http://dx.doi.org/10.1016/j.apcata.2018.11.006
Xiang H; Rasul S; Scott K; Portoles J; Cumpson P; Yu EH, 2019, 'Enhanced selectivity of carbonaceous products from electrochemical reduction of CO2 in aqueous media', Journal of CO2 Utilization, vol. 30, pp. 214 - 221, http://dx.doi.org/10.1016/j.jcou.2019.02.007
Villapún VM; Tardío S; Cumpson P; Burgess JG; Dover LG; González S, 2019, 'Antimicrobial properties of Cu-based bulk metallic glass composites after surface modification', Surface and Coatings Technology, vol. 372, pp. 111 - 120, http://dx.doi.org/10.1016/j.surfcoat.2019.05.041
Tardio S; Cumpson PJ, 2018, 'Practical estimation of XPS binding energies using widely available quantum chemistry software', Surface and Interface Analysis, vol. 50, pp. 5 - 12, http://dx.doi.org/10.1002/sia.6319
Barlow AJ; Sano N; Murdoch BJ; Portoles JF; Pigram PJ; Cumpson PJ, 2018, 'Observing the evolution of regular nanostructured indium phosphide after gas cluster ion beam etching', Applied Surface Science, vol. 459, pp. 678 - 685, http://dx.doi.org/10.1016/j.apsusc.2018.07.195
Ganti S; King PJ; Arac E; Dawson K; Heikkilä MJ; Quilter JH; Murdoch B; Cumpson P; O'Neill A, 2017, 'Voltage Controlled Hot Carrier Injection Enables Ohmic Contacts Using Au Island Metal Films on Ge.', ACS Appl Mater Interfaces, vol. 9, pp. 27357 - 27364, http://dx.doi.org/10.1021/acsami.7b06595
Weston JO; Miyamura H; Yasukawa T; Sutarma D; Baker CA; Singh PK; Bravo-Sanchez M; Sano N; Cumpson PJ; Ryabenkova Y; Kobayashi S; Conte M, 2017, 'Water as a catalytic switch in the oxidation of aryl alcohols by polymer incarcerated rhodium nanoparticles', Catalysis Science & Technology, vol. 7, pp. 3985 - 3998, http://dx.doi.org/10.1039/c7cy01006k
Neagu D; Papaioannou EI; Ramli WKW; Miller DN; Murdoch BJ; Ménard H; Umar A; Barlow AJ; Cumpson PJ; Irvine JTS; Metcalfe IS, 2017, 'Demonstration of chemistry at a point through restructuring and catalytic activation at anchored nanoparticles.', Nat Commun, vol. 8, pp. 1855, http://dx.doi.org/10.1038/s41467-017-01880-y
Murdoch BJ; Barlow AJ; Fletcher IW; Cumpson PJ, 2017, 'The plasmonic properties of argon cluster-bombarded InP surfaces', Applied Physics Letters, vol. 111, pp. 081603 - 081603, http://dx.doi.org/10.1063/1.4993535
Murdoch BJ; Portoles JF; Tardio S; Barlow AJ; Fletcher IW; Cumpson PJ, 2017, 'Erratum: “Visible wavelength surface-enhanced Raman spectroscopy from In-InP nanopillars for biomolecule detection” [Appl. Phys. Lett. 109, 253105 (2016)]', Applied Physics Letters, vol. 110, pp. 139901 - 139901, http://dx.doi.org/10.1063/1.4979551
Wilson TA; Barlow AJ; Foster ML; Bravo Sanchez M; Portoles JF; Sano N; Cumpson PJ; Fletcher IW, 2017, 'In situion beam sputter deposition and X-ray photoelectron spectroscopy (XPS) of multiple thin layers under computer control for combinatorial materials synthesis', Surface and Interface Analysis, vol. 49, pp. 18 - 24, http://dx.doi.org/10.1002/sia.6045
Purvis G; Gray N; Sano N; Barlow A; Cockell C; Abbott GD; van der Land C; Cumpson P, 2017, 'Decontamination of geological samples by gas cluster ion beam etching or ultra violet/ozone', Chemical Geology, vol. 466, pp. 256 - 262, http://dx.doi.org/10.1016/j.chemgeo.2017.06.016
Barlow AJ; Popescu S; Artyushkova K; Scott O; Sano N; Hedley J; Cumpson PJ, 2016, 'Chemically specific identification of carbon in XPS imaging using Multivariate Auger Feature Imaging (MAFI)', Carbon, vol. 107, pp. 190 - 197, http://dx.doi.org/10.1016/j.carbon.2016.05.073
Cumpson PJ; Fletcher IW; Sano N; Barlow AJ, 2016, 'Rapid multivariate analysis of 3D ToF-SIMS data: graphical processor units (GPUs) and low-discrepancy subsampling for large-scale principal component analysis', Surface and Interface Analysis, vol. 48, pp. 1328 - 1336, http://dx.doi.org/10.1002/sia.6042
Sano N; Cumpson PJ, 2016, 'Surface analysis characterisation of gum binders used in modern watercolour paints', Applied Surface Science, vol. 364, pp. 870 - 877, http://dx.doi.org/10.1016/j.apsusc.2015.12.162
Sano N; Purvis GWH; Barlow AJ; Abbott GD; Gray NND; Cumpson PJ, 2016, 'Gas cluster ion beam for the characterization of organic materials in submarine basalts as Mars analogs', Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, vol. 34, pp. 041405 - 041405, http://dx.doi.org/10.1116/1.4954940
Sano N; Barlow AJ; Tsakonas C; Cranton W; Cumpson PJ, 2016, 'Optimal conditions for gas cluster ion beams in studying inorganic interface species: improved chemical information at a ZnO interface', Surface and Interface Analysis, vol. 48, pp. 575 - 579, http://dx.doi.org/10.1002/sia.5949
Cumpson PJ; Fletcher IW; Burnett R; Sano N; Barlow AJ; Portoles JF; Li LW; Kiang AS-H, 2016, 'Multispectral optical imaging combinedin situwith XPS or ToFSIMS and principal component analysis', Surface and Interface Analysis, vol. 48, pp. 1370 - 1378, http://dx.doi.org/10.1002/sia.6046
Murdoch BJ; Portoles JF; Tardio S; Barlow AJ; Fletcher IW; Cumpson PJ, 2016, 'Visible wavelength surface-enhanced Raman spectroscopy from In-InP nanopillars for biomolecule detection', Applied Physics Letters, vol. 109, pp. 253105 - 253105, http://dx.doi.org/10.1063/1.4972558
Barlow AJ; Portoles JF; Sano N; Cumpson PJ, 2016, 'Removing Beam Current Artifacts in Helium Ion Microscopy: A Comparison of Image Processing Techniques.', Microsc Microanal, vol. 22, pp. 939 - 947, http://dx.doi.org/10.1017/S1431927616011673
Cumpson PJ; Sano N; Fletcher IW; Portoles JF; Bravo-Sanchez M; Barlow AJ, 2015, 'Multivariate analysis of extremely large ToFSIMS imaging datasets by a rapid PCA method', Surface and Interface Analysis, vol. 47, pp. 986 - 993, http://dx.doi.org/10.1002/sia.5800
Barlow AJ; Scott O; Sano N; Cumpson PJ, 2015, 'Multivariate Auger Feature Imaging (MAFI) - a new approach towards chemical state identification of novel carbons in XPS imaging', Surface and Interface Analysis, vol. 47, pp. 173 - 175, http://dx.doi.org/10.1002/sia.5738
Barlow AJ; Portoles JF; Cumpson PJ, 2014, 'Observed damage during Argon gas cluster depth profiles of compound semiconductors', Journal of Applied Physics, vol. 116, pp. 054908 - 054908, http://dx.doi.org/10.1063/1.4892097
Bikkarolla SK; Yu F; Zhou W; Joseph P; Cumpson P; Papakonstantinou P, 2014, 'A three-dimensional Mn3O4 network supported on a nitrogenated graphene electrocatalyst for efficient oxygen reduction reaction in alkaline media', J. Mater. Chem. A, vol. 2, pp. 14493 - 14501, http://dx.doi.org/10.1039/c4ta02279c
Bikkarolla SK; Cumpson P; Joseph P; Papakonstantinou P, 2014, 'Oxygen reduction reaction by electrochemically reduced graphene oxide.', Faraday Discuss, vol. 173, pp. 415 - 428, http://dx.doi.org/10.1039/c4fd00088a
Ketebu O; Cumpson P; Yu E, 2014, 'The Effect of Temperature and Agitation on Polyethyleneimine Adsorption on Iron Oxide Magnetic Nanoparticles in the Synthesis of Iron Oxide-Au Core–Shell Nanoparticles', Advanced Science, Engineering and Medicine, vol. 6, pp. 531 - 537, http://dx.doi.org/10.1166/asem.2014.1492
Sano N; Cumpson PJ; Cwiertnia E; Perry JJ; Singer BW, 2014, 'Multivariate analysis studies of the ageing effect for artist's oil paints containing modern organic pigments', Surface and Interface Analysis, vol. 46, pp. 786 - 790, http://dx.doi.org/10.1002/sia.5467
Portoles JF; Cumpson PJ, 2013, 'A compact torsional reference device for easy, accurate and traceable AFM piconewton calibration.', Nanotechnology, vol. 24, pp. 335706, http://dx.doi.org/10.1088/0957-4484/24/33/335706
Cumpson PJ; Portoles JF; Sano N, 2013, 'Observations on X-ray enhanced sputter rates in argon cluster ion sputter depth profiling of polymers', Surface and Interface Analysis, vol. 45, pp. 601 - 604, http://dx.doi.org/10.1002/sia.5198
Cumpson PJ; Portoles JF; Barlow AJ; Sano N; Birch M, 2013, 'Depth profiling organic/inorganic interfaces by argon gas cluster ion beams: sputter yield data for biomaterials, in-vitro diagnostic and implant applications', Surface and Interface Analysis, vol. 45, pp. 1859 - 1868, http://dx.doi.org/10.1002/sia.5333
Cumpson PJ; Portoles JF; Sano N; Barlow AJ, 2013, 'Stability of reference masses: VI. Mercury and carbonaceous contamination on platinum weights manufactured at a similar time as the international and national prototype kilograms', Metrologia, vol. 50, pp. 518 - 531, http://dx.doi.org/10.1088/0026-1394/50/5/518
Cumpson P; Sano N, 2013, 'Stability of reference masses V: UV/ozone treatment of gold and platinum surfaces', Metrologia, vol. 50, pp. 27 - 36, http://dx.doi.org/10.1088/0026-1394/50/1/27
Cumpson PJ; Portoles JF; Sano N, 2013, 'Material dependence of argon cluster ion sputter yield in polymers: Method and measurements of relative sputter yields for 19 polymers', Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, vol. 31, pp. 020605 - 020605, http://dx.doi.org/10.1116/1.4791669
Cumpson PJ; Portoles JF; Sano N; Barlow AJ, 2013, 'X-ray enhanced sputter rates in argon cluster ion sputter-depth profiling of polymers', Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, vol. 31, pp. 021208 - 021208, http://dx.doi.org/10.1116/1.4793284
Escobedo-Cousin E; Vassilevski K; Hopf T; Wright N; O'Neill A; Horsfall A; Goss J; Cumpson P, 2013, 'Local solid phase growth of few-layer graphene on silicon carbide from nickel silicide supersaturated with carbon', Journal of Applied Physics, vol. 113, pp. 114309 - 114309, http://dx.doi.org/10.1063/1.4795501
Cumpson PJ; Sano N; Barlow AJ; Portoles JF, 2013, 'Stability of reference masses: VII. Cleaning methods in air and vacuum applied to a platinum mass standard similar to the international and national kilogram prototypes', Metrologia, vol. 50, pp. 532 - 538, http://dx.doi.org/10.1088/0026-1394/50/5/532
Cumpson PJ; Portoles JF; Barlow AJ; Sano N, 2013, 'Accurate argon cluster-ion sputter yields: Measured yields and effect of the sputter threshold in practical depth-profiling by x-ray photoelectron spectroscopy and secondary ion mass spectrometry', Journal of Applied Physics, vol. 114, pp. 124313 - 124313, http://dx.doi.org/10.1063/1.4823815
Escobedo-Cousin E; Vassilevski K; Hopf T; Wright NG; O’Neill A; Horsfall AB; Goss J; Cumpson P, 2013, 'Optimising the Growth of Few-Layer Graphene on Silicon Carbide by Nickel Silicidation', Materials Science Forum, vol. 740-742, pp. 121 - 124, http://dx.doi.org/10.4028/www.scientific.net/msf.740-742.121
Herrera-Gomez A; Grant JT; Cumpson PJ; Jenko M; Aguirre-Tostado FS; Brundle CR; Conard T; Conti G; Fadley CS; Fulghum J; Kobayashi K; Kövér L; Nohira H; Opila RL; Oswald S; Paynter RW; Wallace RM; Werner WSM; Wolstenholme J, 2009, 'Report on the 47th IUVSTA Workshop ‘Angle-Resolved XPS: the current status and future prospects for angle-resolved XPS of nano and subnano films’', Surface and Interface Analysis, vol. 41, pp. 840 - 857, http://dx.doi.org/10.1002/sia.3105
Tantra R; Gohil D; Cumpson P, 2009, 'Effective platform for the generation of aerosol droplets and application in evaluating the effectiveness of a MEMS-based nanoparticle trapping device', Particuology, vol. 7, pp. 471 - 476, http://dx.doi.org/10.1016/j.partic.2009.09.006
Munz M; Cox DC; Cumpson PJ, 2008, 'Nano-scale shear mode testing of the adhesion of nanoparticles to a surface-support', physica status solidi (a), vol. 205, pp. 1424 - 1428, http://dx.doi.org/10.1002/pssa.200778110
Roy D; Munz M; Colombi P; Bhattacharyya S; Salvetat J-P; Cumpson PJ; Saboungi M-L, 2007, 'Directly writing with nanoparticles at the nanoscale using dip-pen nanolithography', Applied Surface Science, vol. 254, pp. 1394 - 1398, http://dx.doi.org/10.1016/j.apsusc.2007.06.058
Tantra R; Cumpson P, 2007, 'The detection of airborne carbon nanotubes in relation to toxicology and workplace safety', Nanotoxicology, vol. 1, pp. 251 - 265, http://dx.doi.org/10.1080/17435390701675906
Portolés JF; Cumpson PJ; Hedley J; Allen S; Williams PM; Tendler SJB, 2006, 'Accurate velocity measurements of AFM-cantilever vibrations by Doppler interferometry', Journal of Experimental Nanoscience, vol. 1, pp. 51 - 62, http://dx.doi.org/10.1080/17458080500411999
Cumpson PJ; Hedley J; Clifford CA, 2005, 'Microelectromechanical device for lateral force calibration in the atomic force microscope: Lateral electrical nanobalance', Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 23, pp. 1992 - 1992, http://dx.doi.org/10.1116/1.2044809
Cumpson PJPJ; Zhdan P; Hedley J, 2004, 'Calibration of AFM cantilever stiffness: a microfabricated array of reflective springs.', Ultramicroscopy, vol. 100, pp. 241 - 251, http://dx.doi.org/10.1016/j.ultramic.2003.10.005
Cumpson PJ; Hedley J; Clifford CA; Chen X; Allen S, 2004, 'Microelectromechanical system device for calibration of atomic force microscope cantilever spring constants between 0.01 and 4 N/m', Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, vol. 22, pp. 1444 - 1449, http://dx.doi.org/10.1116/1.1763898
Cumpson PJ; Clifford CA; Hedley J, 2004, 'Quantitative analytical atomic force microscopy: a cantilever reference device for easy and accurate AFM spring-constant calibration', Measurement Science and Technology, vol. 15, pp. 1337 - 1346, http://dx.doi.org/10.1088/0957-0233/15/7/016
Cumpson PJ; Hedley J; Zhdan P, 2003, 'Accurate force measurement in the atomic force microscope: a microfabricated array of reference springs for easy cantilever calibration', Nanotechnology, vol. 14, pp. 918 - 924, http://dx.doi.org/10.1088/0957-4484/14/8/314
Cumpson PJ; Hedley J, 2003, 'Accurate analytical measurements in the atomic force microscope: a microfabricated spring constant standard potentially traceable to the SI.', Nanotechnology, vol. 14, pp. 1279 - 1288, http://dx.doi.org/10.1088/0957-4484/14/12/009
Perruchot C; Watts JF; Lowe C; White RG; Cumpson PJ, 2002, 'Angle-resolved XPS characterization of urea formaldehyde-epoxy systems', Surface and Interface Analysis, vol. 33, pp. 869 - 878, http://dx.doi.org/10.1002/sia.1465
Lea C; Cumpson PJ, 2002, 'Preface', Surface and Interface Analysis, vol. 33, pp. 176 - 177, http://dx.doi.org/10.1002/sia.1199
Cumpson PJ, 2001, 'Estimation of inelastic mean free paths for polymers and other organic materials: use of quantitative structure-property relationships', Surface and Interface Analysis, vol. 31, pp. 23 - 34, http://dx.doi.org/10.1002/sia.948
Cumpson PJ, 2000, 'The Thickogram: a method for easy film thickness measurement in XPS', Surface and Interface Analysis, vol. 29, pp. 403 - 406, http://dx.doi.org/10.1002/1096-9918(200006)29:6<403::aid-sia884>3.0.co;2-8
Seah MP; Spencer SJ; Cumpson PJ; Johnstone JE, 2000, 'Sputter-induced cone and filament formation on InP and AFM tip shape determination', Surface and Interface Analysis, vol. 29, pp. 782 - 790, http://dx.doi.org/10.1002/1096-9918(200011)29:11<782::aid-sia929>3.0.co;2-1
Seah MP; Spencer SJ; Cumpson PJ; Johnstone JE, 1999, 'Cones formed during sputtering of InP and their use in defining AFM tip shapes', Applied Surface Science, vol. 144-145, pp. 151 - 155, http://dx.doi.org/10.1016/s0169-4332(98)00794-6
Cumpson PJ, 1999, 'Angle-resolved XPS depth-profiling strategies', Applied Surface Science, vol. 144-145, pp. 16 - 20, http://dx.doi.org/10.1016/s0169-4332(98)00752-1
Cumpson PJ; Seah MP, 1997, 'Elastic Scattering Corrections in AES and XPS. II. Estimating Attenuation Lengths and Conditions Required for their Valid Use in Overlayer/Substrate Experiments', Surface and Interface Analysis, vol. 25, pp. 430 - 446, http://dx.doi.org/10.1002/(sici)1096-9918(199706)25:6<430::aid-sia254>3.0.co;2-7
Cumpson PJ, 1997, 'Elastic Scattering Corrections in AES and XPS. III. Behaviour of Electron Transport Mean Free Path in Solids for Kinetic Energies in the Range 100 eVSurface and Interface Analysis, vol. 25, pp. 447 - 453, http://dx.doi.org/10.1002/(sici)1096-9918(199706)25:6<447::aid-sia272>3.0.co;2-q
Jackson AR; El Gomati MM; Matthew JAD; Cumpson PJ, 1997, 'Monte Carlo Calculations of The Depth Distribution Function in Multilayered Structures', Surface and Interface Analysis, vol. 25, pp. 341 - 351, http://dx.doi.org/10.1002/(sici)1096-9918(199705)25:5<341::aid-sia242>3.0.co;2-h
Cumpson PJ; Seah MP; Spencer SJ, 1996, 'Simple Procedure for Precise Peak Maximum Estimation for Energy Calibration inAES andXPS', Surface and Interface Analysis, vol. 24, pp. 687 - 694, http://dx.doi.org/10.1002/(sici)1096-9918(19960930)24:10<687::aid-sia174>3.0.co;2-q
Cumpson PJ; Seah MP, 1996, 'Stability of reference masses. IV: Growth of carbonaceous contamination on platinum-iridium alloy surfaces, and cleaning by UV/ozone treatment', Metrologia, vol. 33, pp. 507 - 532, http://dx.doi.org/10.1088/0026-1394/33/6/1
Cumpson PJ; Seah MP, 1995, 'Stability of Reference Masses III: Mechanism and Long-term Effects of Mercury Contamination on Platinum-Iridium Mass Standards', Metrologia, vol. 31, pp. 375 - 388, http://dx.doi.org/10.1088/0026-1394/31/5/005
Cumpson PJ, 1995, 'Angle-resolved XPS and AES: Depth-resolution limits and a general comparison of properties of depth-profile reconstruction methods', Journal of Electron Spectroscopy and Related Phenomena, vol. 73, pp. 25 - 52, http://dx.doi.org/10.1016/0368-2048(94)02270-4
Seah MP; Qiu JH; Cumpson PJ; Castle JE, 1994, 'Stability of Reference Masses II: The Effect of Environment and Cleaning Methods on the Surfaces of Stainless Steel and Allied Materials', Metrologia, vol. 31, pp. 93 - 108, http://dx.doi.org/10.1088/0026-1394/31/2/002
Cumpson PJ; Seah MP, 1994, 'Stability of Reference Masses I: Evidence for Possible Variations in the Mass of Reference Kilograms Arising from Mercury Contamination', Metrologia, vol. 31, pp. 21 - 26, http://dx.doi.org/10.1088/0026-1394/31/1/004
Seah MP; Qiu JH; Cumpson PJ; Castle JE, 1994, 'Simple method of depth profiling (stratifying) contamination layers, illustrated by studies on stainless steel', Surface and Interface Analysis, vol. 21, pp. 336 - 341, http://dx.doi.org/10.1002/sia.740210603
Seah MP; Cumpson PJ, 1993, 'Signal-to-noise ratio assessment and measurement in spectroscopies with particular reference to Auger and X-ray photoelectron spectroscopies', Journal of Electron Spectroscopy and Related Phenomena, vol. 61, pp. 291 - 308, http://dx.doi.org/10.1016/0368-2048(93)80021-d
Cumpson PJ, 1993, 'Elastic scattering corrections in AES and XPS: I. Two rapid Monte Carlo methods for calculating the depth distribution function', Surface and Interface Analysis, vol. 20, pp. 727 - 741, http://dx.doi.org/10.1002/sia.740200818
Cumpson PJ; Seah MP, 1992, 'Random uncertainties in AES and XPS: I: Uncertainties in peak energies, intensities and areas derived from peak synthesis', Surface and Interface Analysis, vol. 18, pp. 345 - 360, http://dx.doi.org/10.1002/sia.740180508
Cumpson PJ; Seah MP, 1992, 'Random uncertainties in AES and XPS: II: Quantification using either relative or absolute measurements', Surface and Interface Analysis, vol. 18, pp. 361 - 367, http://dx.doi.org/10.1002/sia.740180509
Seah MP; Cumpson PJ, 1992, 'Comment on ‘spectral noise removal by digital filtering and its application to surface analysis’ by K. Piyakis and E. Sacher', Applied Surface Science, vol. 62, pp. 195 - 198, http://dx.doi.org/10.1016/0169-4332(92)90146-o
Cumpson PJ; Seah MP, 1990, 'The quartz crystal microbalance; radial/polar dependence of mass sensitivity both on and off the electrodes', Measurement Science and Technology, vol. 1, pp. 544 - 555, http://dx.doi.org/10.1088/0957-0233/1/7/002

Preprints

Sheriff J; Fletcher IW; Cumpson PJ, 2020, Computer-readable Image Markers for Automated Registration in Correlative Microscopy autoCRIM
Cumpson PJ; Jaskiewicz M; Kim W, 2017, Argon Cluster-Ion Sputter Yield: Molecular Dynamics Simulations on Silicon and an Equation for Estimating Total Sputter Yield
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Contact

+61-2-93854850