The JEOL 7001F is a Schottky field emission scanning electron microscope. The Schottky field emission electron gun produces a very finely focused, high current electron beam suitable for specialist high resolution microstructural analysis of inorganic materials. The "below lens" configured 7001F can accommodate specimens of up to 25mm in diameter, but specimen tilt is restricted because of the presence of a number of specialist microanalytical detectors within the specimen chamber. The 7001F is equipped with an Everhart-Thornley secondary electron detector which provides images of the surface topography. A backscattered electron detector can be used to obtain compositional contrast. A JEOL silicon drift energy dispersive x-ray analyser is interfaced to the column which allows micro-elemental analysis to be performed. In addition the 7001F is equipped with an Electron BackScatter Diffraction (EBSD) system which provides information about the surface structure and orientation of flat crystalline materials.
For further information about the use of the JEOL 7001F please contact Simon Hager