The JEOL F200 in E10 has been specially configured for our range of in-situ holders. These holders allow samples to be heated in vacuum, liquid or gaseous environments, and the resulting changes can be recorded at up to 100 fps.

The JEOL F200  is a versatile analytical transmission electron microscope (TEM) and scanning transmission electron microscope (STEM) that is well-suited for routine high-resolution work of materials samples. It can image nanoparticles, metals, semiconductors, photovoltaic materials, and ferroelectric materials with atomic resolution. F200 (E10) has a cold field emission gun (FEG) that can operate at 200 kV or 80 kV (under special request). The high brightness and coherence of the cold FEG mean that this microscope is ideally suited for analytical microscopy of materials. The F200 has a lattice resolution of 0.16 nm in ADF STEM mode and 0.1 nm in TEM mode at 200 kV.

The F200 is equipped with a  JEOL 100 mm² energy-dispersive X-ray (EDX) detector, with an energy resolution of 130 eV (Mn K) and a collection angle of 0.9 steradian. The F200 EDX efficiently collects X-rays from the sample, resulting in high-quality elemental maps.