The JEOL 1400 transmission electron microscope operates at accelerating voltages up to 120kV. The microscope is equipped with a high contrast lens configuration especially suited to imaging biological, medical or polymer specimens that lack electron density and inherent contrast. Specimens undergo preparation procedures to ensure they are 100 nm or thinner in order to transmit the electron beam. Dense regions within the specimen cause electrons to scatter and an aperture, positioned near the specimen in the electron column, prevents the scattered electrons from reaching the imaging plane. This results in light and dark regions or ‘contrast’ within the TEM image. The microscope is equipped with a Gatan digital camera and Digital Micrograph software to facilitates the acquisition of digital images. For enquiries regarding TEM access and training, please contact Rhiannon Kuchel.
