The Philips CM200 field emission transmission electron microscope allows very high resolution images to be obtained from thin (electron transparent) materials. In a field emission gun a very strong electric field is used to extract electrons from a metal filament. This results in an electron beam which is very bright. Ultimately, this microscope allows individual atoms to be imaged. The CM200 TEM allows structural, crystallographic and elemental studies of materials. This microscope has a Bruker QUANTAX energy dispersive x-ray spectroscopy system interfaced to it, which can allow elemental analysis from regions as small as 10 nm in diameter to be obtained. In addition, it has a GATAN ORIUS camera for direct recording of digital images.
For further information on the use of this instrument please contact Sean Lim.