Ms Katie Jean Levick

Laboratory Manager

Research profile: Click to view

Biography

Education

B.Agr.Sc (Hons) – University of Melbourne (1991)

MSc (Physics) – University of New South Wales (2013)

Role and Interests

Initial user contact for TEM

Trainer on TEM, AFM, SEM, Micro-CT and FIB

My Research Activities

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Publications

Conference Papers

Levick KJ;Stevens-Kalceff MA, 2011, 'Cathodoluminescence and Kelvin probe microscopy of focused ion beam processed cadmium sulphide crystals', in White T (ed.), Proceedings of the Australian Microbeam Analysis Society Symposium 2011, Australian Microbeam Analysis Society, Canberra, presented at Australian Microbeam Analysis Society Symposium 2011, Canberra, 01 February 2011
Levick KJ;Stevens-Kalceff MA;Al Shalabi Z;Doran P, 2010, 'Microanalysis of focused ion beam processed cadmium sulphide crystals', in 21st Australian Conference on Microscopy and Microanalysis 2010,, Australian Microscopy and Microanalysis Society, Brisbane Australia, pp. 173, presented at 21st Australian Conference on Microscopy and Microanalysis 2010, Brisbane Australia, 11 - 15 July 2010
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Journal articles

Shokri A;Pahlevani F;Levick K;Cole I;Sahajwalla V, 2017, 'Synthesis of copper-tin nanoparticles from old computer printed circuit boards', Journal of Cleaner Production, vol. 142, pp. 2586 - 2592, http://dx.doi.org/10.1016/j.jclepro.2016.11.017
Stevens-Kalceff MA;Levick KJ, 2007, 'The assessment of microscopic charging effects induced by focused electron and ion beam irradiation of dielectrics', Microscopy Research and Technique, vol. 70, pp. 195 - 204, http://dx.doi.org/10.1002/jemt.20399
Levick KJ;Stevens-Kalceff M;Zhao H;Doran PM, 2006, 'Production of cadmium sulphide quantum dot nanoparticles using tomato hairy root tissue culture: Ultrastructural effects and localization of cadmium', Microscopy and Microanalysis, vol. 12, pp. 622 - 623, http://dx.doi.org/10.1017/S1431927606067754
Stevens-Kalceff MA;Levick KJ, 2004, 'Mitigation of localized charging induced in insulating materials by a focused ion beam', Microscopy and Microanalysis, vol. 10, pp. 1116 - 1117, http://dx.doi.org/10.1017/S1431927604884575
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Contact

+61-2-9385 6391