Surface Analysis Laboratory

Who we are

The Surface Analysis Laboratory specialises in advanced surface characterisation using X-ray Photoelectron Spectroscopy (XPS), Ultraviolet Photoelectron Spectroscopy (UPS), and Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS). These techniques enable precise determination of elemental and chemical composition, spatial distribution, and molecular structural identification of the outermost layers (the first 5–10 atomic layers) of solid surfaces. The lab is also equipped to measure variations in composition with depth, providing a comprehensive understanding of multilayered structures and interfaces.

With state-of-the-art instrumentation and extensive technical expertise, the Surface Analysis Laboratory delivers high-quality, detailed surface characterisations to support research, innovation, and materials advancements across scientific and industrial applications.

Funding partners:

Capabilities

Elemental analysis

All elements in the periodic table except H and He can be semi-quantified by XPS - detection limit is 0.1-0.2 atomic percent. All elements and their isotopes can be qualitatively or semi-quantitatively analysed by ToF-SIMS - detection limits as low as ppb or ppm levels.

Chemical state determination

XPS analysis can help determine the chemical state of detected elements, such as metallic states, oxidized states and functional groups.

2D imaging

Both XPS and ToF-SIMS analysis can provide 2D imaging that shows lateral distribution of detected elements/molecular over a submillimeter size area.

Depth profile

In-depth elemental analysis can be qualitatively conducted by ToF-SIMS and quantitatively analysed by XPS.

3D rendering

3D rendering shows 3D distributions of detected elements, in combination of 2D imaging and depth profiling by ToF-SIMS.

UPS

UPS, using ultraviolent sources to analyse valence band of very topmost surface of solid materials, measurement of work function of the surface.

Molecular analysis

Molecular compounds (including polymers, organic compounds, and up to ~amino acids) can be detected by ToF-SIMS. 2D imaging, depth profile and 3D rendering are also available for any detectable compounds and their fragments.

Mass spectra

Spectra are preliminary information the instruments collected. By processing and explaining the spectra we obtain the chemical overview of the sample.

Instruments

Time-of-flight secondary ion mass spectrometer for molecular and elemental surface analysis using a bismuth cluster analysis beam. Elemental and isotopic imaging down to 100 nm lateral resolution, and Angstrom-resolution depth profiling (cesium, oxygen and argon-cluster ion beams) is also available from this instrument.

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Thermo ESCALAB250i high-resolution X-ray Photoelectron Spectrometer (XPS) using a monochromatic Al Kalpha soft X-ray source, a monoatomic argon ion beam for depth profiling, variable-temperature stage, and He UV Source for ultraviolet photoelectron spectroscopy.

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Our people

Bin Gong

Senior Technical Officer

Phone: 02 9385 4694
Email: b.gong@unsw.edu.au

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Songyan Yin

Senior Technical Officer

Phone: 02 9385 4694
Email: songyan.yin@unsw.edu.au

Fees

At the Surface Analysis Laboratory, we provide fee-for-service analysis.

UNSW-subsidised rate: $80/hour (for UNSW users only)
External academic and industry rate: Higher fees apply (+GST)

Note: All fees are subject to annual CPI adjustments.

How to access

To schedule a consultation or arrange training, please contact us directly.
A sample analysis request form is required for XPS / ToF-SIMS analysis.

Analysis request form

Fee table

Instrument	Technique	UNSW Internal	External Institution	External Industry
XPS	XPS Standard	$100/sample	$200/sample	$300/sample
UPS Standard	$50/sample	$100/sample	$150/sample
Depth profile	$100/hour	$200/hour	$300/hour
Mapping
ToF - SIMS	Mass Spectra	$100/hour	$200/hour	$300/hour
2D Imaging
Depth Profile
3D Rendering
Special booking for sensitive samples	$50/session	$50/session	$50/session

To start the onboarding process, simply sign up to UNSW's ACLS booking system (button below). Once registered you can choose Surface Analysis Laboratory from the list of facilities to reserve time on the instruments.

Go to ACLS

Once you have completed the registration, you'll get an email detailing the next steps for onboarding. This email will include a link to a form where you can describe your project. Based on your needs, we will tailor a team to meet with you and address your requirements.

During this meeting, we will explain how to gain access to our lab space and what training will be required. Additionally, we will discuss your research project to match you with the most suitable instrument for your research question.

Access will be granted once you complete your online lab induction and receive in-person training from our staff on all relevant instruments. Our training is thorough and designed to accommodate individuals who have no prior experience with technical equipment.

Surface analysis involves the analysis of the top 1-10 nm of the sample; thus, it is extremely sensitive to any sample preparation treatments. There is typically a residue related to any pre-treatment of the sample, and "adventitious" (or environmental) contamination in the form of compounds absorbed onto material surfaces from the atmosphere might always be present.

In general, we analyze samples "as received." Guidelines on how to prepare your samples for the best outcomes are available in the sample preparation document.

Surface Analysis Lab provides free access for users to submit samples and request forms from 8am-6pm on workdays. You can drop off your samples and request form on our sample submission table during this time. We will do the analysis for you.

Analysis request form

Results will be available within one week from when your samples and request form are well received.