Instruments

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MPD (PANalytical) Xpert Multipurpose X-ray Diffraction System

The MPD is a Bragg-Brentano geometry X-ray diffractometer suitable for routine measurement of powder samples, either phase identification or quantitative analysis. The instrument is equipped with the following components:

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Empyrean 2 (PANalytical) X-ray Diffraction System (Cobalt)

The Empyrean 2 is a Bragg-Brentano geometry X-ray diffractometer that was installed in 2014 and is equipped with the following components:

  • Cobalt anode X-ray tube to minimise fluorescence from iron-containing samples that occurs when using the standard copper X-ray anode
  • High resolution optic for cobalt X-rays to minimise scatter at low angles
  • Sample changer for large batches 

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MRD (PANalytical) Xpert Materials Research diffractometer

The MRD is a highly flexible X-ray diffraction system, equipped with X-ray mirror, (220) Ge monochromator, X-ray lens, mono-capillary, triple-axis goniometer, and is used for analysis of thin films, nanostructure, semiconductor materials, stresses and textures. It is equipped with a few active components, such as an X-ray mirror, Ge 220 monochromator, X-ray lens and mono-capillary for incident beam conditioning, and parallel plate collimator or triple-axis for diffracted beam conditioning. Both proportional and area detectors are available.

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Empyrean 1 (PANalytical) Thin-Film XRD

The Empyrean Thin-Film XRD installed in 2013, provides thin-film analysis or BB geometry with variable temperature stages and reaction cell for in situ studies.

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D8 (Bruker) Thin-Film XRD with 5kW Rotating Anode

The D8 is a flexible instrument with a rotating copper anode X-ray source (5-6 kW) that enables a higher X-ray flux at your sample than is possible with the sealed X-ray sources on the other instruments. It uses a centric Eulerian cradle that integrates Chi and Phi rotations, and X-Y-Z translations. The instrument can be set up with a 1-dimensional compound silicon strip detector (the "Lynx-Eye") for ultra fast X-ray diffraction measurements, as well as a large area detector (the "VÅNTEC-500" with 13.5 cm diameter) for 2D XRD experiments including RSM and diffraction mapping.

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SC-XRD Kappa Apex (Bruker) Single Crystal Diffractometer

The Bruker Kappa Apex is fitted with an Incoatec molybdenum X-ray microfocus source to determine the molecular and crystal structure of materials from a single crystal. The instruments is usually operated on a service-basis by an experienced crystallogrpahy, although user training is encouraged.

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XRD Experiments Using Variable Temperature or Controlled Atmophere

The diffraction instruments have a range of accessories for dynamic monitoring of phase changes from 10-1800 Kelvin, in certain cases using a controlled atmosphere.

Bruker D8 with rotating anode copper source:

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Leica 165C Microscope

The Leica microscope has a large working distance between the objective and sample and an incident cold light source to enable our crystallographers to mount single-crystals onto a capillary, prior to measuring the diffraction pattern. Images and dimensions of a crystal can be collected using the CCD camera. When not in use by our crystallographers, the microscope may be used, at no cost, by UNSW researchers who require a low to medium magnification (max.90x) digital image of their sample.

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Thin Film Analyser - Mikropack NanoCalc 2000 UV-Vis-NIR

The instrument is a UV-visible-NIR thin film analyser which can provide a measurement of the thickness of multilayer films. The instrument measures light reflected perpendicular to a sample surface which can provide information on the thickness of up to 4 layers in a sample, and is useful for an independent comparison with film-thickness measurements obtained on the MRD. The wavelengths available range from 250nm to 850nm, which enable measurement of film thickness from 10nm up to 20micron. This instrument is located in lab G65, and it available at no charge to UNSW users.

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Smartlab (Rigaku) 9kW rotating anode thin-film XRD

High intensity (9kW) rotating copper anode X-ray source for rapid analysis of thin films.

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Empyrean 3 (PANalytical) XRD with Ag source and PSD

The Empyrean 3 is fitted with a silver source and a position-sensitive detector to instantly capture a wide 2-theta angular range during an in situ XRD experiment without the need to scan the detector. The instrument can run capillary samples and the high energy silver source also enables the instrument to perform the pair distribution function (PDF) experiment that describes the distribution of distances between pairs of atoms within a material.

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