SSEAU

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    SOLID STATE AND ELEMENTAL ANALYSIS UNIT (SSEAU)

    • Elemental Analysis: Inductively coupled plasma (ICP) and X-ray fluorescence (XRF) spectrometry, combustion/oxidation analysis of organic C, H, N, S, and O.
    • Surface Analysis: X-ray photoelectron spectroscopy (XPS and UPS) and time of flight secondary ion mass spectrometry (ToF-SIMS).
    • Structural Analysis: crystallography and X-ray diffraction (XRD) of powders and thin-films.

     

    CHRONOS 14CARBON-CYCLE FACILITY

       

      ACCESS COSTS

      • Access costs can be found under "related documents" to the right of this page.
      • For XRF and combustion analysis costs please contact Irene Wainwright

       

      VIRTUAL TOUR

      Take a virtual tour of our surface analysis and single-crystal XRD laboratory.

       

      CONTACTS FOR TRAINING AND ANALYTICAL SERVICES

      XPS, UPS, stylus-profiler Songyan Yin  
      XPS or inorganic/semiconductor ToF-SIMS Bill Gong  
      ToF-SIMS imaging of organic/biological samples Soshan Cheong  
      Elemental analysis of carbon, hydrogen, nitrogen, sulphur in organic solids Helen Wang   
      XRF chemical analysis Irene Wainwright  
      XRF microscopy Helen Wang   
      Dissolved organic carbon analysis (DOC, LC-OCD) Khorshed Chinu  
      ICP-OES and ICP-MS Dorothy Yu Rabeya Akter
      Laser ablation ICP-MS Rabeya Akter  
      Anion chromatography Rabeya Akter  
      XRD thin-film analysis Yu Wang Daniel Sando
      XRD phase analysis and support Saroj Bhattacharyya Ruoming Tian
      Chemical crystallography for molecular structure determination Mohan Bhadbhade  
      Radiocarbon dating (facility under construction)

      Chris Turney

      		 Christopher Marjo

      See specific lab pages on this website for more information.

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      Authorised by the Managing Director of Mark Wainwright Analytical Centre, UNSW CRICOS Provider Code 00098G, ABN 57 195 873 179

      Mark Wainwright Analytical Centre, UNSW, Sydney, NSW, 2052, Australia | Email: analytical@unsw.edu.au