SOLID STATE AND ELEMENTAL ANALYSIS UNIT (SSEAU) Elemental Analysis: Inductively coupled plasma (ICP) and X-ray fluorescence (XRF) spectrometry, combustion/oxidation analysis of organic C, H, N, S, and O. Surface Analysis: X-ray photoelectron spectroscopy (XPS and UPS) and time of flight secondary ion mass spectrometry (ToF-SIMS). Structural Analysis: crystallography and X-ray diffraction (XRD) of powders and thin-films. CHRONOS 14CARBON-CYCLE FACILITY Accelerator Mass Spectrometry (AMS) for radiocarbon (14C) dating. Pricing - see "Related Documents" to the right. Take a virtual tour of the Chronos Facility. Watch a time-lapse video of the installation of our MICADAS accelerator. ACCESS COSTS Access costs can be found under "Related Documents" to the right of this page. For XRF and combustion analysis costs please contact Irene Wainwright VIRTUAL TOURS Take a virtual tour of our Surface analysis and Single-Crystal XRD laboratory. Take a virtual tour of the Chronos Facility. Take a virtual tour of the XRD Laboratory. CONTACTS FOR TRAINING AND ANALYTICAL SERVICES XPS, UPS, stylus-profiler Songyan Yin XPS or inorganic/semiconductor ToF-SIMS Bill Gong ToF-SIMS imaging of organic/biological samples Soshan Cheong Elemental analysis of carbon, hydrogen, nitrogen, sulphur in organic solids Helen Wang Brit David XRF chemical analysis Helen Wang Brit David XRF microscopy Helen Wang Brit David Dissolved organic carbon analysis (DOC, LC-OCD) Khorshed Chinu Maria Veronica Chandra-Hioe ICP-OES and ICP-MS Rabeya Akter Khorshed Chinu Laser ablation ICP-MS Rabeya Akter Anion chromatography Khorshed Chinu Maria Veronica Chandra-Hioe XRD thin-film analysis Yu Wang Daniel Sando XRD phase analysis and support Saroj Bhattacharyya Ruoming Tian Chemical crystallography for molecular structure determination Mohan Bhadbhade Cambridge structural database licence (renewed annually) Christopher Marjo Radiocarbon dating Chris Turney Christopher Marjo See specific lab pages on this website for more information. REFERENCING AND ACKNOWLEDGEMENT We ask that the SSEAU be acknowledged in all publications and communications which result from access to our facilities and expertise. This information is required for reporting to funding bodies and provides a means of measuring our impact and is essential for the SSEAU’s continued support and expansion of its capabilities. We suggest using the the following forms of acknowledgement: The authors acknowledge use of facilities in the Solid State & Elemental Analysis Unit at Mark Wainwright Analytical Centre. The authors acknowledge use of facilities and the assistance of <Name of SSEAU staff member/s> in the Solid State & Elemental Analysis Unit at Mark Wainwright Analytical Centre.