SSEAU

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    SOLID STATE AND ELEMENTAL ANALYSIS UNIT (SSEAU)

    • Elemental Analysis: Inductively coupled plasma (ICP) and X-ray fluorescence (XRF) spectrometry, combustion/oxidation analysis of organic C, H, N, S, and O.
    • Surface Analysis: X-ray photoelectron spectroscopy (XPS and UPS) and time of flight secondary ion mass spectrometry (ToF-SIMS).
    • Structural Analysis: crystallography and X-ray diffraction (XRD) of powders and thin-films.

     

    ACCESS COSTS

    • Access costs can be found under "related documents" to the right of this page.
    • For XRF and combustion analysis costs please contact Irene Wainwright

     

    CONTACTS FOR TRAINING AND ANALYTICAL SERVICES

    XPS, UPS, stylus-profiler Songyan Yin  
    XPS or inorganic/semiconductor ToF-SIMS Bill Gong  
    ToF-SIMS imaging of organic/biological samples Soshan Cheong  
    Elemental analysis of carbon, nitrogen, sulphur in organic solids Helen Wang   
    XRF chemical analysis Irene Wainwright  
    Dissolved organic carbon analysis (DOC, LC-OCD) Khorshed Chinu  
    ICP-OES and ICP-MS Dorothy Yu  
    Laser ablation ICP-MS Rabeya Akter  
    Anion chromatography Rabeya Akter  
    XRD thin-film analysis Yu Wang Daniel Sando
    XRD phase analysis and support Saroj Bhattacharyya Ruoming Tian
    Chemical crystallography for molecular structure determination Mohan Bhadbhade  

    See specific lab pages on this website for more information.