CONTACTS FOR TRAINING AND ANALYTICAL SERVICES COMMERCIAL ANALYSIS External projects involving chemical analysis, surface analysis or mineral identification and quantification. ccl@unsw.edu.au Phone: 02 9348 1400 CHEMICAL ANALYSIS XRF chemical analysis. Elemental combustion analysis (C, H, N, S, O). Chemical imaging (XRF microscopy) xrf@unsw.edu.au ICP-OES and ICP-MS chemical analysis Dissolved organic carbon analysis (DOC, LC-OCD) Anion chromatography Discrete analysis (aqueous NH3, NOx-). icplab@unsw.edu.au RADIOCARBON DATING Radiocarbon (carbon-14) dating. Stable isotopes in organics: carbon-13, nitrogen-14 (IRMS). chronos@unsw.edu.au SURFACE ANALYSIS Surface profiling (stylus-profiler). Surface chemical analysis, depth profiling & imaging (XPS, ToF-SIMS). Valence band analysis (HOMO, DoS, surface photoelectric workfunction (UPS) surface@unsw.edu.au Epitaxial thin-film analysis (XRD). xrd@unsw.edu.au X-RAY ANALYSIS Photoelectron spectroscopy (XPS). surface@unsw.edu.au XRF chemical analysis. XRF microscopy. xrf@unsw.edu.au XRD thin-film analysis XRD phase analysis and support xrd@unsw.edu.au Chemical crystallography for molecular structure determination. crystallab@unsw.edu.au Access to Cambridge structural database licence (renewed annually) 3D X-ray imaging (Tyree X-ray Micro-CT Facility) TyreeXray@unsw.edu.au See specific lab pages on this website for more information. SOLID STATE AND ELEMENTAL ANALYSIS UNIT (SSEAU) Elemental Analysis: Inductively coupled plasma (ICP) and X-ray fluorescence (XRF) spectrometry, combustion/oxidation analysis of organic C, H, N, S, and O. Surface Analysis: X-ray photoelectron spectroscopy (XPS and UPS) and time of flight secondary ion mass spectrometry (ToF-SIMS). Structural Analysis: crystallography and X-ray diffraction (XRD) of powders and thin-films. TYREE X-RAY CT FACILITY High resolution X-ray computed tomography of mineral and materials. ACCESS COSTS Access costs can be found under "Related Documents" to the right of this page. For XRF and combustion analysis costs please contact Tasmia or Brit VIRTUAL TOURS Take a virtual tour of our Surface analysis and Single-Crystal XRD laboratory. Take a virtual tour of the Chronos Facility. Take a virtual tour of the XRD Laboratory. REFERENCING AND ACKNOWLEDGEMENT We ask that the SSEAU be acknowledged in all publications and communications which result from access to our facilities and expertise. This information is required for reporting to funding bodies and provides a means of measuring our impact and is essential for the SSEAU’s continued support and expansion of its capabilities. We suggest using the the following forms of acknowledgement: The authors acknowledge use of facilities in the Solid State & Elemental Analysis Unit at Mark Wainwright Analytical Centre. The authors acknowledge use of facilities and the assistance of <Name of SSEAU staff member/s> in the Solid State & Elemental Analysis Unit at Mark Wainwright Analytical Centre. AUTHORSHIP The staff of the SSEAU do not automatically assume publication co-authorship for collection of data from your samples. In certain rare circumstances a scientific contribution, eg. a detailed data interpretation for the project and contribution to the manuscript, may justify co-authorship, but this should be discussed with the staff member or the Head of the SSEAU. The university provides clear guidelines around authorship at https://www.gs.unsw.edu.au/policy/documents/researchauthorproc.pdf.
