SSEAU

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    SOLID STATE AND ELEMENTAL ANALYSIS UNIT (SSEAU)

    • Elemental Analysis: Inductively coupled plasma (ICP) and X-ray fluorescence (XRF) spectrometry, combustion/oxidation analysis of organic C, H, N, S, and O.
    • Surface Analysis: X-ray photoelectron spectroscopy (XPS and UPS) and time of flight secondary ion mass spectrometry (ToF-SIMS).
    • Structural Analysis: crystallography and X-ray diffraction (XRD) of powders and thin-films.

     

    CHRONOS 14CARBON-CYCLE FACILITY

       

      ACCESS COSTS

      • Access costs can be found under "Related Documents" to the right of this page.
      • For XRF and combustion analysis costs please contact Irene Wainwright

       

      VIRTUAL TOUR

      Take a virtual tour of our surface analysis and single-crystal XRD laboratory.

       

      CONTACTS FOR TRAINING AND ANALYTICAL SERVICES

      XPS, UPS, stylus-profiler Songyan Yin  
      XPS or inorganic/semiconductor ToF-SIMS Bill Gong  
      ToF-SIMS imaging of organic/biological samples Soshan Cheong  
      Elemental analysis of carbon, hydrogen, nitrogen, sulphur in organic solids Helen Wang   
      XRF chemical analysis Irene Wainwright  
      XRF microscopy Helen Wang   
      Dissolved organic carbon analysis (DOC, LC-OCD) Khorshed Chinu  
      ICP-OES and ICP-MS Dorothy Yu Rabeya Akter
      Laser ablation ICP-MS Rabeya Akter  
      Anion chromatography Rabeya Akter  
      XRD thin-film analysis Yu Wang Daniel Sando
      XRD phase analysis and support Saroj Bhattacharyya Ruoming Tian
      Chemical crystallography for molecular structure determination Mohan Bhadbhade  
      Radiocarbon dating (final commissioning underway)

      Chris Turney

      Christopher Marjo

      See specific lab pages on this website for more information.

       

      REFERENCING AND ACKNOWLEDGEMENT

      It is a condition of use that the SSEAU be acknowledged in all publications and communications which result from access to our facilities and expertise. This information is required for reporting to funding bodies and provides a means of measuring our impact and is essential for the SSEAU’s continued support and expansion of its capabilities. 

      We suggest using the the following forms of acknowledgement:

      • The authors acknowledge use of facilities in the Solid State & Elemental Analysis Unit at Mark Wainwright Analytical Centre.
      • The authors acknowledge use of facilities and the assistance of <Name of SSEAU staff member/s> in the Solid State & Elemental Analysis Unit at Mark Wainwright Analytical Centre.