Yu Zhang (YoYo) - School of Photovoltaic and Renewable Energy Engineering (SPREE)
This SEM image shows the cross-section of a silicon solar cell TEM sample prepared the using in-situ liftout technique. Top side is a 3um thick Pt later deposited on top of silicon wafer in order to protect the surface morphology, bottom side is the silicon substrate. When transferring the micro-sized sample from its original place into sample grids, people need to weld sample by Pt deposition. The deposition current is too high so excessive local heat recrystallize the Si sample and re-shape the top Pt layer into micro/nano-spherical structure.
Image by: Yu Zhang
Supervisors: A/Prof. Bram Hoex & Dr.David Payne
Microscope/Technique: PFIB, TEM sample Insitu Liftout