The NanoSEM 230 is a field-emission scanning electron microscope (FE-SEM), which attains ultra-high imaging resolution without the specimen size restrictions of a conventional in-lens FE-SEM due to the advanced design of the electron optics. The NanoSEM 450’s Schottky field-emission source allows the user to achieve high imaging resolution at a range of kV, at both low (high-resolution imaging) and high (microanalytical imaging) currents. Secondary electron (SE) imaging can be undertaken in both field-free and immersion mode for comprehensive low-to-high resolution imaging of a variety of samples. The Nova NanoSEM 230 is configured with a Bruker SDD-EDS detector and can be manually fitted with a backscattered electron detector for the convenient visualisation of compositional differences across the specimen surface. For specialty STEM work, a STEM detector is also available on the NanoSEM 230.
For enquiries regarding SEM access and training, please contact Karen Privat.