SEM - FEI Nova NanoSEM 450 FE-SEM

The NanoSEM 450 is a field-emission scanning electron microscope (FE-SEM), which attains ultra-high imaging resolution without the specimen size restrictions of a conventional in-lens FE-SEM due to the advanced design of the electron optics. The NanoSEM 450’s Schottky field-emission source allows the user to achieve high imaging resolution at a range of kV, at both low (high-resolution imaging) and high (microanalytical imaging) currents. Secondary electron (SE) imaging can be undertaken in both field-free and immersion mode for comprehensive low-to-high resolution imaging of a variety of samples. The NanoSEM 450 is fitted with a retractable annular backscattered electron detector as well as a Bruker SDD-EDS detector for the convenient visualisation of compositional differences across the specimen surface.

For enquiries regarding access and training, please contact Karen Privat