The FEI Tecnai G2 20 TEM allows high resolution images to be obtained from thin (electron transparent) materials. The Tecnai TEM has a thermionic source (LaB6) and may be easily operated at different accelerating voltages. This makes it suitable for a wide range of specimens. The Tecnai TEM allows structural, crystallographic and elemental studies of materials. This microscope has a Bruker QUANTAX energy dispersive x-ray spectroscopy system interfaced to it and a BM Eagle digital camera for image acquisition. In addition, the microscope has a High Angle Annular Dark Field (HAADF) detector.