Research Associate
Biography
Education
PhD Physics, University of Bristol, UK (2015)
MSci Physics, University of Bristol, UK (2011)
Role
To train, aid and manage users on the JEOL F200 microscope
Research Interests
My interests lie in the application of electron microscopy methods to determine composition, structure and defect nature of semiconductors, mainly III-nitrides. My present research includes the application of electron microscopy to InxGa1-xN nanorods and films for use in LED and transistor devices. Recent research has included:
- the compositional profiling, using energy dispersive X-ray spectroscopy, of InxGa1-xN nanorods to understand the growth mechanisms of these structures,
- the application of electron diffraction techniques to determine the structure of materials, mainly semiconductors and
- the use of novel substrates, such as polycrystalline diamond, for improved thermal characteristics of semiconductor devices.
Publications
GaN/InGaN:
Microstructure of In x Ga1− x N nanorods grown by molecular beam epitaxy
RF Webster, QY Soundararajah, IJ Griffiths, D Cherns… - Semiconductor Science and Technology, 2015
Electron microscopy of gallium nitride growth on polycrystalline diamond
RF Webster, D Cherns, M Kuball, Q Jiang, D Allsopp - Semiconductor Science and Technology, 2015
Compositional variations in In0. 5Ga0. 5N nanorods grown by molecular beam epitaxy
D Cherns, RF Webster, SV Novikov, CT Foxon… - Nanotechnology, 2014
Other:
P Huang, MMA Kalyar, RF Webster, D Cherns… - Nanoscale, 2014
My Research Activities
Education
PhD Physics, University of Bristol, UK (2015)
MSci Physics, University of Bristol, UK (2011)
Role
To operate the newly purchased JEOL F200 microscope, design and implement research experiments in collaboration with researchers across the University in the area of advanced transmission electron microscopy, including high-resolution imaging, electron diffraction, energy-dispersive X-ray spectroscopy analysis, and other imaging and analysis modes where applicable.
Research Interests
My interests lie in the application of electron microscopy methods to determine composition, structure and defect nature of semiconductors, mainly III-nitrides. My present research includes the application of electron microscopy to InxGa1-xN nanorods and films for use in LED and transistor devices.
Publications
