Instruments

Searching all SALab (no technique) instruments. Search all instruments.

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Thermo ESCALAB250Xi X-ray photoelectron spectrometer (XPS)

Thermo ESCALAB250Xi X-ray photoelectron spectrometer (XPS) with depth profile and elemental imaging capability.

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Time of Flight Secondary Ion Mass Spectrometer (TOFSIMS)

The ION-TOF TOF.SIMS 5  was installed in to our lab in May 2015. The instrument is located in F10:G61. Contact Dr Bill Gong (b.gong@unsw.edu.au) for more details on its capabilities.

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Stylus Profiler

The Alpha-Step D-600 provides rapid, high resolution 2D and 3D profiling of a sample surface with a vertical range of 1200 micrometers and sub-Angstrom resolution. The instrument has a high resolution camera for visualising the sample, and a 200 mm motorised stage with a range of motion of 150 x 178 mm. The data is particularly useful for calibrating depth profiles performed on the XPS or TOFSIMS.

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