Instruments

Thermo ESCALAB250i XPS

Thermo ESCALAB250i high-resolution X-ray Photoelectron Spectrometer (XPS) using a monochromatic Al Kalpha soft X-ray source, a monoatomic argon ion beam for depth profiling, variable-temperature stage, and He UV Source for ultraviolet photoelectron spectroscopy. Located in F10:G63.

ION-TOF TOFSIMS 5

Time-of-flight secondary ion mass spectrometer for molecular and elemental surface analysis using a bismuth cluster analysis beam. Elemental and isotopic imaging down to 100 nm lateral resolution, and Angstrom-resolution depth profiling (Cs and argon-cluster ion beams) is also available from this instrument. Located in F10:G63.