Instruments

Thermo ESCALAB250i XPS

Thermo ESCALAB250i high-resolution X-ray Photoelectron Spectrometer (XPS) using a monochromatic Al Kalpha soft X-ray source, a monoatomic argon ion beam for depth profiling, variable-temperature stage, and He UV Source for ultraviolet photoelectron spectroscopy. Located in F10:G63.

ION-TOF TOFSIMS 5

Time-of-flight secondary ion mass spectrometer for molecular and elemental surface analysis using a bismuth cluster analysis beam. Elemental and isotopic imaging down to 100 nm lateral resolution, and Angstrom-resolution depth profiling (caesium, oxygen and argon-cluster ion beams) is also available from this instrument. Located in F10:G63.

AlphaStep D-600 Stylus Profiler

Profiler for 1D and 2D acquisition of surface profiles. Suitable for XPS and ToF-SIMS crater depth measurement. Also suitable for surfaces too rough for AFM. The vertical range is 0 - 1200 μm with sub-nanometer depth precision.

The system has a motorised XY stage with movement of 150 x 178 mm, and scan lengths up to 55 mm. Samples fitted to a 200 mm diameter vacuum chuck. Side view camera optics have a 3760 x 3120 μm field of view for selecting the region of interest.

Located in F10:G63, training required, but free to access.