Thin Film Analyser - Mikropack NanoCalc 2000 UV-Vis-NIR

The instrument is a UV-visible-NIR thin film analyser which can provide a measurement of the thickness of multilayer films. The instrument measures light reflected perpendicular to a sample surface which can provide information on the thickness of up to 4 layers in a sample, and is useful for an independent comparison with film-thickness measurements obtained on the MRD. The wavelengths available range from 250nm to 850nm, which enable measurement of film thickness from 10nm up to 20micron. This instrument is located in lab G65, and it available at no charge to UNSW users.